Investigation of veryintenseD3-band emission in multi-crystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging
Thøgersen, Annett; Jensen, Ingvild Julie Thue; Graff, Joachim Seland; Ringdalen, Inga Gudem; Almeida Carvalho, Patricia; Mehl, Torbjørn; Zhu, Junjie; Burud, Ingunn; Olsen, Espen; Søndenå, Rune
Peer reviewed, Journal article
Published version
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