Investigation of veryintenseD3-band emission in multi-crystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging

Thøgersen, Annett; Jensen, Ingvild Julie Thue; Graff, Joachim Seland; Ringdalen, Inga Gudem; Almeida Carvalho, Patricia; Mehl, Torbjørn; Zhu, Junjie; Burud, Ingunn; Olsen, Espen; Søndenå, Rune
Peer reviewed, Journal article
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https://hdl.handle.net/11250/2993845
Date
2022
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Original version
Journal of Applied Physics. 2022, 131(14).   https://doi.org/10.1063/5.0087119
Journal
Journal of Applied Physics