dc.contributor.author | Thøgersen, Annett | |
dc.contributor.author | Jensen, Ingvild Julie Thue | |
dc.contributor.author | Mehl, Torbjørn | |
dc.contributor.author | Burud, Ingunn | |
dc.contributor.author | Olsen, Espen | |
dc.contributor.author | Ringdalen, Inga Gudem | |
dc.contributor.author | Zhu, Junjie | |
dc.contributor.author | Søndenå, Rune | |
dc.date.accessioned | 2024-05-31T08:33:10Z | |
dc.date.available | 2024-05-31T08:33:10Z | |
dc.date.created | 2024-04-25T13:34:22Z | |
dc.date.issued | 2024 | |
dc.identifier.citation | Journal of Applied Physics. 2024, 135 (13), . | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.uri | https://hdl.handle.net/11250/3132072 | |
dc.language.iso | eng | |
dc.title | Investigation of the areas with high D07-band emission in multicrystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging | |
dc.title.alternative | Investigation of the areas with high D07-band emission in multicrystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging | |
dc.type | Peer reviewed | |
dc.type | Journal article | |
dc.description.version | publishedVersion | |
dc.source.pagenumber | 7 | |
dc.source.volume | 135 | |
dc.source.journal | Journal of Applied Physics | |
dc.source.issue | 13 | |
dc.identifier.doi | 10.1063/5.0196586 | |
dc.identifier.cristin | 2264519 | |
dc.relation.project | Norges forskningsråd: 280909 | |
dc.relation.project | Norges forskningsråd: 197405 | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |