dc.contributor.author | Mehl, Torbjørn | |
dc.contributor.author | Di Sabatino Lundberg, Marisa | |
dc.contributor.author | Adamczyk, Krzysztof | |
dc.contributor.author | Burud, Ingunn | |
dc.contributor.author | Olsen, Espen | |
dc.date.accessioned | 2017-09-26T09:22:24Z | |
dc.date.available | 2017-09-26T09:22:24Z | |
dc.date.created | 2017-01-24T14:39:40Z | |
dc.date.issued | 2016 | |
dc.identifier.citation | Energy Procedia. 2016, 92 130-137. | nb_NO |
dc.identifier.issn | 1876-6102 | |
dc.identifier.uri | http://hdl.handle.net/11250/2456715 | |
dc.language.iso | eng | nb_NO |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/deed.no | * |
dc.title | Defects in multicrystalline Si wafers studied by spectral photoluminescence imaging, combined with EBSD and dislocation mapping | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.source.pagenumber | 130-137 | nb_NO |
dc.source.volume | 92 | nb_NO |
dc.source.journal | Energy Procedia | nb_NO |
dc.identifier.doi | 10.1016/j.egypro.2016.07.043 | |
dc.identifier.cristin | 1436754 | |
cristin.unitcode | 192,1,1,0 | |
cristin.unitname | Institutt for matematiske realfag og teknologi | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |