Blar i Brage NMBU på forfatter "Adamczyk, Krzysztof"
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Defects in multicrystalline Si wafers studied by spectral photoluminescence imaging, combined with EBSD and dislocation mapping
Mehl, Torbjørn; Di Sabatino Lundberg, Marisa; Adamczyk, Krzysztof; Burud, Ingunn; Olsen, Espen (Journal article; Peer reviewed, 2016)